Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade.

The Review of scientific instruments

PubMedID: 27910673

Aguiam DE, Silva A, Bobkov V, Carvalho PJ, Carvalho PF, Cavazzana R, Conway GD, D'Arcangelo O, Fattorini L, Faugel H, Fernandes A, Fünfgelder H, Gonçalves B, Guimarais L, De Masi G, Meneses L, Noterdaeme JM, Pereira RC, Rocchi G, Santos JM, Tuccillo AA, Tudisco O, ASDEX Upgrade Team. Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade. Rev Sci Instrum. 2016;87(11):11E722.
A new multichannel frequency modulated continuous-wave reflectometry diagnostic has been successfully installed and commissioned on ASDEX Upgrade to measure the plasma edge electron density profile evolution in front of the Ion Cyclotron Range of Frequencies (ICRF) antenna. The design of the new three-strap ICRF antenna integrates ten pairs (sending and receiving) of microwave reflectometry antennas. The multichannel reflectometer can use three of these to measure the edge electron density profiles up to 2 × 10(19) m(-3), at different poloidal locations, allowing the direct study of the local plasma layers in front of the ICRF antenna. ICRF power coupling, operational effects, and poloidal variations of the plasma density profile can be consistently studied for the first time. In this work the diagnostic hardware architecture is described and the obtained density profile measurements were used to track outer radial plasma position and plasma shape.