AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale

Ultramicroscopy

PubMedID: 10741664

Tolstikhina AL, Belugina NV, Shikin SA. AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale. Ultramicroscopy. 2000;82(1-4):149-52.
Atomic force microscopy has been used for the study of the surface topography and domain structures of triglycin sulfate (TGS) crystals. The images of various types of domains at the polar (0 1 0) surfaces of as-cleaved TGS crystals have been obtained (in contact mode and resonant mode). The crystals grown old, after annealing, gamma-irradiated by various doses, were studied. It has been found that the surface relief of crystals after annealing differs from that of crystals grown old and irradiated: in the first case the peak-to-peak value is nearly constant whereas in the second case it varies in wide limits. The parameters of domain structure were determined. These parameters have been shown to be different for crystals grown old, crystals after annealing and irradiated crystals. It has been shown that, after cantilever scanning after a long period in different AFM modes the TGS surface experiences a partial polarization reversal.